Information-expert system for complex diagnostics and investigation of emitters and charged particle beams

L. I. Antonova, V. P. Denisov, N. V. Egorov, A. G. Karpov, A. M. Ovsyannikov, V. R. Tolstyakov, O. A. Kharitonov

Результат исследований: Научные публикации в периодических изданияхстатьярецензирование


The system is described for measuring a total complex of characteristics of charged particle sources. The system controls, acquires and processes obtained data automatically. The system operates on the base of the IBM PC/AT computers. The soft- and hardware are designed. By means of the system investigations on field electron and ion sources with the current density to 1·108 A/cm2 were performed. The composition and specifications of the system are presented.

Язык оригиналарусский
Страницы (с-по)206-207
Число страниц2
ЖурналPribory i Tekhnika Eksperimenta
Номер выпуска3
СостояниеОпубликовано - 1 мая 1995

Предметные области Scopus

  • Контрольно-измерительные инструменты