Graphite oxide Auger-electron diagnostics

V. M. Mikoushkin, A. S. Kriukov, V. V. Shnitov, A. P. Solonitsyna, V. Yu Fedorov, A. T. Dideykin, D. A. Sakseev, O. Yu Vilkov, V. M. Lavchiev

Результат исследований: Научные публикации в периодических изданияхстатья

4 Цитирования (Scopus)

Выдержка

Graphite oxide (GO) nanofilms on the SiO2/Si surface have been studied by photoelectron spectroscopy (XPS) with synchrotron radiation and by Auger electron spectroscopy (AES). Auger electron energies were determined for the basic functional GO groups: hydroxyl (COH) and epoxide (COC). The data obtained enabled developing a technique for the GO chemical and elemental composition determination. The technique allows controlling the hydrogen content in GO despite the impossibility of Auger emission from hydrogen.

Язык оригиналаанглийский
Страницы (с-по)51-55
Число страниц5
ЖурналJournal of Electron Spectroscopy and Related Phenomena
Том199
DOI
СостояниеОпубликовано - 2015

Отпечаток

Graphite
Oxides
graphite
oxides
Electrons
Hydrogen
electrons
epoxy compounds
Epoxy Compounds
hydrogen
Auger electron spectroscopy
Photoelectron spectroscopy
Synchrotron radiation
Hydroxyl Radical
Auger spectroscopy
electron spectroscopy
synchrotron radiation
chemical composition
X ray photoelectron spectroscopy
photoelectron spectroscopy

Предметные области Scopus

  • Электроника, оптика и магнитные материалы
  • Радиация
  • Атомная и молекулярная физика и оптика
  • Физика конденсатов
  • Спектроскопия
  • Физическая и теоретическая химия

Цитировать

Mikoushkin, V. M., Kriukov, A. S., Shnitov, V. V., Solonitsyna, A. P., Fedorov, V. Y., Dideykin, A. T., ... Lavchiev, V. M. (2015). Graphite oxide Auger-electron diagnostics. Journal of Electron Spectroscopy and Related Phenomena, 199, 51-55. https://doi.org/10.1016/j.elspec.2015.01.001
Mikoushkin, V. M. ; Kriukov, A. S. ; Shnitov, V. V. ; Solonitsyna, A. P. ; Fedorov, V. Yu ; Dideykin, A. T. ; Sakseev, D. A. ; Vilkov, O. Yu ; Lavchiev, V. M. / Graphite oxide Auger-electron diagnostics. В: Journal of Electron Spectroscopy and Related Phenomena. 2015 ; Том 199. стр. 51-55.
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title = "Graphite oxide Auger-electron diagnostics",
abstract = "Graphite oxide (GO) nanofilms on the SiO2/Si surface have been studied by photoelectron spectroscopy (XPS) with synchrotron radiation and by Auger electron spectroscopy (AES). Auger electron energies were determined for the basic functional GO groups: hydroxyl (COH) and epoxide (COC). The data obtained enabled developing a technique for the GO chemical and elemental composition determination. The technique allows controlling the hydrogen content in GO despite the impossibility of Auger emission from hydrogen.",
keywords = "AES, Chemical composition, Epoxide, Graphite oxide, Hydroxyl, XPS",
author = "Mikoushkin, {V. M.} and Kriukov, {A. S.} and Shnitov, {V. V.} and Solonitsyna, {A. P.} and Fedorov, {V. Yu} and Dideykin, {A. T.} and Sakseev, {D. A.} and Vilkov, {O. Yu} and Lavchiev, {V. M.}",
year = "2015",
doi = "10.1016/j.elspec.2015.01.001",
language = "English",
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journal = "Journal of Electron Spectroscopy and Related Phenomena",
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Mikoushkin, VM, Kriukov, AS, Shnitov, VV, Solonitsyna, AP, Fedorov, VY, Dideykin, AT, Sakseev, DA, Vilkov, OY & Lavchiev, VM 2015, 'Graphite oxide Auger-electron diagnostics', Journal of Electron Spectroscopy and Related Phenomena, том. 199, стр. 51-55. https://doi.org/10.1016/j.elspec.2015.01.001

Graphite oxide Auger-electron diagnostics. / Mikoushkin, V. M.; Kriukov, A. S.; Shnitov, V. V.; Solonitsyna, A. P.; Fedorov, V. Yu; Dideykin, A. T.; Sakseev, D. A.; Vilkov, O. Yu; Lavchiev, V. M.

В: Journal of Electron Spectroscopy and Related Phenomena, Том 199, 2015, стр. 51-55.

Результат исследований: Научные публикации в периодических изданияхстатья

TY - JOUR

T1 - Graphite oxide Auger-electron diagnostics

AU - Mikoushkin, V. M.

AU - Kriukov, A. S.

AU - Shnitov, V. V.

AU - Solonitsyna, A. P.

AU - Fedorov, V. Yu

AU - Dideykin, A. T.

AU - Sakseev, D. A.

AU - Vilkov, O. Yu

AU - Lavchiev, V. M.

PY - 2015

Y1 - 2015

N2 - Graphite oxide (GO) nanofilms on the SiO2/Si surface have been studied by photoelectron spectroscopy (XPS) with synchrotron radiation and by Auger electron spectroscopy (AES). Auger electron energies were determined for the basic functional GO groups: hydroxyl (COH) and epoxide (COC). The data obtained enabled developing a technique for the GO chemical and elemental composition determination. The technique allows controlling the hydrogen content in GO despite the impossibility of Auger emission from hydrogen.

AB - Graphite oxide (GO) nanofilms on the SiO2/Si surface have been studied by photoelectron spectroscopy (XPS) with synchrotron radiation and by Auger electron spectroscopy (AES). Auger electron energies were determined for the basic functional GO groups: hydroxyl (COH) and epoxide (COC). The data obtained enabled developing a technique for the GO chemical and elemental composition determination. The technique allows controlling the hydrogen content in GO despite the impossibility of Auger emission from hydrogen.

KW - AES

KW - Chemical composition

KW - Epoxide

KW - Graphite oxide

KW - Hydroxyl

KW - XPS

UR - http://www.scopus.com/inward/record.url?scp=84923239950&partnerID=8YFLogxK

U2 - 10.1016/j.elspec.2015.01.001

DO - 10.1016/j.elspec.2015.01.001

M3 - Article

AN - SCOPUS:84923239950

VL - 199

SP - 51

EP - 55

JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

SN - 0368-2048

ER -

Mikoushkin VM, Kriukov AS, Shnitov VV, Solonitsyna AP, Fedorov VY, Dideykin AT и соавт. Graphite oxide Auger-electron diagnostics. Journal of Electron Spectroscopy and Related Phenomena. 2015;199:51-55. https://doi.org/10.1016/j.elspec.2015.01.001