Extended core structure and luminescence of a-screw dislocations in GaN

O. S. Medvedev, O. F. Vyvenko, E. V. Ubyivovk, S. V. Shapenkov, M. Seibt

Результат исследований: Научные публикации в периодических изданияхстатья в журнале по материалам конференции

1 цитирование (Scopus)

Выдержка

Straight segments of a-screw dislocations introduced by scratching of basal (0001) of intentionally undoped low-ohmic GaN radiate a doublet of narrow luminescent lines in the spectral region at about 3.1-3.2 eV while the dislocation intersection points possess luminescence band at about 3.3 eV. Transmission electron microscopy reveals that the dislocation cores are dissociated into two 300 partials separated by stacking fault (SF) ribbon with the width of 4-6 nm width and that the dislocation nodes contain extended SF of sizes of 25-30 nm. Dislocation-related luminescence (DRL) is ascribed to exciton bound by the states of partial dislocation cores and of SF quantum well. The increase of the SF lateral sizes is assumed to cause the DRL spectral shift between straight dislocations and their nodes due to the system dimensionality transition from 1D to 2D respectively.

Язык оригиналаанглийский
Номер статьи012006
ЖурналJournal of Physics: Conference Series
Том1190
Номер выпуска1
DOI
СостояниеОпубликовано - 23 мая 2019
Событие19th International Conference on Extended Defects in Semiconductors, EDS 2018 - Thessaloniki, Греция
Продолжительность: 24 июн 201829 июн 2018

Отпечаток

screw dislocations
luminescence
crystal defects
intersections
ribbons
excitons
quantum wells
transmission electron microscopy
causes
shift

Предметные области Scopus

  • Физика и астрономия (все)

Цитировать

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abstract = "Straight segments of a-screw dislocations introduced by scratching of basal (0001) of intentionally undoped low-ohmic GaN radiate a doublet of narrow luminescent lines in the spectral region at about 3.1-3.2 eV while the dislocation intersection points possess luminescence band at about 3.3 eV. Transmission electron microscopy reveals that the dislocation cores are dissociated into two 300 partials separated by stacking fault (SF) ribbon with the width of 4-6 nm width and that the dislocation nodes contain extended SF of sizes of 25-30 nm. Dislocation-related luminescence (DRL) is ascribed to exciton bound by the states of partial dislocation cores and of SF quantum well. The increase of the SF lateral sizes is assumed to cause the DRL spectral shift between straight dislocations and their nodes due to the system dimensionality transition from 1D to 2D respectively.",
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Extended core structure and luminescence of a-screw dislocations in GaN. / Medvedev, O. S.; Vyvenko, O. F.; Ubyivovk, E. V.; Shapenkov, S. V.; Seibt, M.

В: Journal of Physics: Conference Series, Том 1190, № 1, 012006, 23.05.2019.

Результат исследований: Научные публикации в периодических изданияхстатья в журнале по материалам конференции

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AU - Vyvenko, O. F.

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AU - Seibt, M.

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