Diffraction pattern degradation driven by intense ultrafast X-ray pulse for H2+

Результат исследований: Научные публикации в периодических изданияхстатьярецензирование


The drastic evolution of molecular systems exposed to ultrashort intense X-ray pulse is a fundamental obstacle for single-particle imaging (SPI) by means of X-ray free electron lasers (XFEL). Here we tackle the simplest molecule H2+ and its diffraction pattern degradations in the strong ultrashort X-ray beam. The semiclassical method of the problem solution and its advantages are described in detail. We apply the method to calculate the electron density autocorrelation functions (ACF) for a few internuclear distances and then discuss numeric simulation data.
Язык оригиналаанглийский
Номер статьи127088
ЖурналPhysics Letters A
Ранняя дата в режиме онлайн14 дек 2020
СостояниеОпубликовано - 15 фев 2021

Предметные области Scopus

  • Физика и астрономия (все)

Ключевые слова

  • X-ray free electron lasers
  • XFEL
  • Molecular degradation
  • Ionization
  • Hydrogen ion
  • Single-particle imaging