Atomic Structure Probing of Thin Metal Films via Vacuum Holographic Microscopy

N. V. Egorov, L. I. Antonova, V. V. Trofimov, A. Yu Gileva

Результат исследований: Научные публикации в периодических изданияхстатья

Выдержка

Abstract—: A vacuum holographic microscope is designed to probe the atomic structure of thin metal films. The experimental setup is based on the use of a source of a monochromatic low-energy electron beam induced by a tip cathode spaced from the sample at a distance of several tens of nanometers. The visual resolution of atoms of the object requires a microscope magnification of at least 105, which necessitates high-accuracy movement of the electron source. The parameters of principal nodes of the microscope, which are responsible for the generation and recording of useful signals, are studied and optimized, as well.

Язык оригиналаанглийский
Страницы (с-по)1267-1271
Число страниц5
ЖурналJournal of Surface Investigation X-Ray, Synchrotron and Neutron Techniques
Том13
Номер выпуска6
DOI
СостояниеОпубликовано - 1 ноя 2019

Отпечаток

Microscopic examination
Microscopes
Metals
Vacuum
Electron sources
Electron beams
Cathodes
Atoms

Предметные области Scopus

  • Поверхности, слои и пленки

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Atomic Structure Probing of Thin Metal Films via Vacuum Holographic Microscopy. / Egorov, N. V.; Antonova, L. I.; Trofimov, V. V.; Gileva, A. Yu.

В: Journal of Surface Investigation X-Ray, Synchrotron and Neutron Techniques, Том 13, № 6, 01.11.2019, стр. 1267-1271.

Результат исследований: Научные публикации в периодических изданияхстатья

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