Accounting for the plasma background radiation influence and calibration curve export in atomic emission spectrometry with CCD-based registration system when determining metal and alloy impurities

V. S. Sukhomlinov, A. S. Mustafaev, A. N. Popova

Результат исследований: Научные публикации в периодических изданияхстатья в журнале по материалам конференциирецензирование

Аннотация

This paper is dedicated to development and application of an algorithm allowing determining an accurate actual value of the plasma background radiation under the analytic element line using standard data obtained from emission spectrometer registration system. A unique technique has been developed that allows calibrating spectrometers in the range of small concentration of impurities with two standard samples, which is very relevant for analysis of metals and alloys, powdered samples, ultrapure materials. The paper demonstrates efficiency of this technique when applied to series-produced emission spectrometers manufactured in Russia.

Язык оригиналаанглийский
Номер статьи012044
ЖурналJournal of Physics: Conference Series
Том1753
Номер выпуска1
DOI
СостояниеОпубликовано - 8 фев 2021
СобытиеInternational Conference on Innovations, Physical Studies and Digitalization in Mining Engineering 2020, IPDME 2020 - Saint Petersburg, Российская Федерация
Продолжительность: 23 апр 202024 апр 2020

Предметные области Scopus

  • Физика и астрономия (все)

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