Research output: Contribution to journal › Article › peer-review
Three stages of Si transformation into SiC by the method of coordinated substitution of atoms. / Кукушкин, Сергей Арсеньевич; Убыйвовк, Евгений Викторович; Воробьёв, М.Г.; Grashchenko, Aleksandr S.; Осипов, А.В.
In: Thin Solid Films, Vol. 839, 140908, 01.04.2026.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Three stages of Si transformation into SiC by the method of coordinated substitution of atoms
AU - Кукушкин, Сергей Арсеньевич
AU - Убыйвовк, Евгений Викторович
AU - Воробьёв, М.Г.
AU - Grashchenko, Aleksandr S.
AU - Осипов, А.В.
PY - 2026/4/1
Y1 - 2026/4/1
N2 - The mechanism of the sequential stages of the heterogeneous chemical reaction between gaseous carbon monoxide and the surface of monocrystalline silicon is investigated. As a result of this reaction, the silicon surface is transformed into an epitaxial silicon carbide surface. A significant time-dependent change in the microstructure and properties of the forming SiC layers has been observed. The microstructure and properties of the SiC/Si layers were analyzed using reflection high-energy electron diffraction (RHEED) and spectroscopic ellipsometry (SE), while the evolution of the SiC–Si interfacial structure was studied using scanning electron microscopy (SEM) and transmission electron microscopy (TEM). It has been established that during the first five minutes of synthesis the elastic strain transitions from compressive to tensile. It was observed that the “precarbide” layer consists of twinned ordered layers located parallel to the interface in the (111) plane, with a period of 0.252 nm and a triple periodicity, i.e., with a spacing of 0.756 nm.
AB - The mechanism of the sequential stages of the heterogeneous chemical reaction between gaseous carbon monoxide and the surface of monocrystalline silicon is investigated. As a result of this reaction, the silicon surface is transformed into an epitaxial silicon carbide surface. A significant time-dependent change in the microstructure and properties of the forming SiC layers has been observed. The microstructure and properties of the SiC/Si layers were analyzed using reflection high-energy electron diffraction (RHEED) and spectroscopic ellipsometry (SE), while the evolution of the SiC–Si interfacial structure was studied using scanning electron microscopy (SEM) and transmission electron microscopy (TEM). It has been established that during the first five minutes of synthesis the elastic strain transitions from compressive to tensile. It was observed that the “precarbide” layer consists of twinned ordered layers located parallel to the interface in the (111) plane, with a period of 0.252 nm and a triple periodicity, i.e., with a spacing of 0.756 nm.
KW - Elastic strains
KW - Heterogeneous reactions
KW - Microstructure evolution
KW - Nanostructures
KW - Silicon carbide on silicon
KW - Silicon carbide synthesis
UR - https://www.mendeley.com/catalogue/2baea813-c325-3c0f-ba41-9eae5e251da2/
UR - https://www.scopus.com/pages/publications/105034259736
U2 - 10.1016/j.tsf.2026.140908
DO - 10.1016/j.tsf.2026.140908
M3 - Article
VL - 839
JO - Thin Solid Films
JF - Thin Solid Films
SN - 0040-6090
M1 - 140908
ER -
ID: 150939261