The applicability of Raman spectroscopy for estimation of interfaces thickness in the AlN/GaN superlattices

D.V. Pankin, M.B. Smirnov

Research outputpeer-review

Original languageUndefined
Pages (from-to)83-90
JournalST. PETERSBURG POLYTECHNIC UNIVERSITY JOURNAL: PHYSICS AND MATHEMATICS
Volume2
Issue number2
DOIs
Publication statusPublished - 2016

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