The applicability of Raman spectroscopy for estimation of interfaces thickness in the AlN/GaN superlattices

Research output › peer-review

Original language	Undefined
Pages (from-to)	83-90
Journal	ST. PETERSBURG POLYTECHNIC UNIVERSITY JOURNAL: PHYSICS AND MATHEMATICS
Volume	2
Issue number	2
DOIs	https://doi.org/10.1016/j.spjpm.2016.05.014
Publication status	Published - 2016

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@article{5d9d53950a9a480a8bd6296a9bf64ea8,

title = "The applicability of Raman spectroscopy for estimation of interfaces thickness in the AlN/GaN superlattices",

author = "D.V. Pankin and M.B. Smirnov",

year = "2016",

doi = "10.1016/j.spjpm.2016.05.014",

language = "не определен",

volume = "2",

pages = "83--90",

journal = "ST. PETERSBURG POLYTECHNIC UNIVERSITY JOURNAL: PHYSICS AND MATHEMATICS",

issn = "2405-7223",

publisher = "Издательство Санкт-Петербургского Государственного Политехнического Университета",

number = "2",

}

TY - JOUR

T1 - The applicability of Raman spectroscopy for estimation of interfaces thickness in the AlN/GaN superlattices

AU - Pankin, D.V.

AU - Smirnov, M.B.

PY - 2016

Y1 - 2016

U2 - 10.1016/j.spjpm.2016.05.014

DO - 10.1016/j.spjpm.2016.05.014

M3 - статья

VL - 2

SP - 83

EP - 90

JO - ST. PETERSBURG POLYTECHNIC UNIVERSITY JOURNAL: PHYSICS AND MATHEMATICS

JF - ST. PETERSBURG POLYTECHNIC UNIVERSITY JOURNAL: PHYSICS AND MATHEMATICS

SN - 2405-7223

IS - 2

ER -