Statistical analysis of AFM, TEM and SEM micrographs of fibrils formed by the Sup35 yeast protein

Research output

Original languageEnglish
Pages217
Number of pages1
Publication statusPublished - 2017
EventPRION 2017 - 14th International Conference Deciphering Neurodegenerative Disorders - Эдинбург
Duration: 23 May 201726 May 2017
http://prion2017.org

Conference

ConferencePRION 2017 - 14th International Conference Deciphering Neurodegenerative Disorders
CountryUnited Kingdom
CityЭдинбург
Period23/05/1726/05/17
Internet address

Cite this

Соколов, П. А. (2017). Statistical analysis of AFM, TEM and SEM micrographs of fibrils formed by the Sup35 yeast protein. 217. Abstract from PRION 2017 - 14th International Conference Deciphering Neurodegenerative Disorders, Эдинбург, .
Соколов, Петр Александрович. / Statistical analysis of AFM, TEM and SEM micrographs of fibrils formed by the Sup35 yeast protein. Abstract from PRION 2017 - 14th International Conference Deciphering Neurodegenerative Disorders, Эдинбург, .1 p.
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title = "Statistical analysis of AFM, TEM and SEM micrographs of fibrils formed by the Sup35 yeast protein",
author = "Соколов, {Петр Александрович}",
year = "2017",
language = "English",
pages = "217",
note = "null ; Conference date: 23-05-2017 Through 26-05-2017",
url = "http://prion2017.org",

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Statistical analysis of AFM, TEM and SEM micrographs of fibrils formed by the Sup35 yeast protein. / Соколов, Петр Александрович.

2017. 217 Abstract from PRION 2017 - 14th International Conference Deciphering Neurodegenerative Disorders, Эдинбург, .

Research output

TY - CONF

T1 - Statistical analysis of AFM, TEM and SEM micrographs of fibrils formed by the Sup35 yeast protein

AU - Соколов, Петр Александрович

PY - 2017

Y1 - 2017

M3 - Abstract

SP - 217

ER -

Соколов ПА. Statistical analysis of AFM, TEM and SEM micrographs of fibrils formed by the Sup35 yeast protein. 2017. Abstract from PRION 2017 - 14th International Conference Deciphering Neurodegenerative Disorders, Эдинбург, .