Plasmon-enhanced Electron Scattering in Nanostructured Thin Metal Films Revealed by Low-voltage Scanning Electron Microscopy

V. Mikhailovskii, Yu. Petrov, O. Vyvenko

Research outputpeer-review

Abstract

The drastic enhancement of backscattered electrons (BSE) yield from nanostructured thin metal film which exceeded well the one from massive metal was observed at accelerating voltages below 400 V. The dependences of BSE signal from nanostructured gold film on accelerating voltage and on retarding grid potential applied to BSE detector were investigated. It was shown that enhanced BSE signal was formed by inelastic scattered electrons coming from the gaps between nanoparticles. A tentative explanation of the mechanism of BSE signal enhancement was suggested.
Original languageEnglish
Title of host publicationPlasmon-enhanced Electron Scattering in Nanostructured Thin Metal Films Revealed by Low-voltage Scanning Electron Microscopy
PublisherAmerican Institute of Physics
Number of pages5
ISBN (Print)9780735414051
DOIs
Publication statusPublished - 2016

Fingerprint Dive into the research topics of 'Plasmon-enhanced Electron Scattering in Nanostructured Thin Metal Films Revealed by Low-voltage Scanning Electron Microscopy'. Together they form a unique fingerprint.

  • Cite this

    Mikhailovskii, V., Petrov, Y., & Vyvenko, O. (2016). Plasmon-enhanced Electron Scattering in Nanostructured Thin Metal Films Revealed by Low-voltage Scanning Electron Microscopy. In Plasmon-enhanced Electron Scattering in Nanostructured Thin Metal Films Revealed by Low-voltage Scanning Electron Microscopy American Institute of Physics. https://doi.org/10.1063/1.4954339