Morphology and the magnetic and conducting properties of heterogeneous layered magnetic structures [(Co45fe45zr10)35(al2o3)65/a-si:H]36

E.A. Yadkina, A.A. Vorobiev, V.A. Ukleev, D. Lott, A.V. Sitnikov, Y.E. Kalinin, O.V. Gerashchenko, S.V. Grigoriev

Research output

7 Citations (Scopus)

Abstract

© Pleiades Publishing, Inc., 2014. The morphology and the magnetic and conducting properties of an amorphous multilayer nano-system [(Co45Fe45Zr10)35(Al2O3)65/a-Si:H]36 consisting of (Co45Fe45Zr10)35(Al2O3)65 magnetic layers and semiconducting hydrogenated amorphous silicon (a-Si:H) layers of various thicknesses have been studied. Using a combination of methods (including polarized neutron reflectometry and grazing incidence small-angle X-ray scattering), it is shown that the magnetic and electrical properties of these multilayer structures are determined by their morphology. It is established that the magnetization and electric resistance of a sam-ple is a nonmonotonic function of the a-Si:H layer thickness. Both characteristics are at a minimum for a structure with a semiconductor layer thickness of 0.4 nm. Samples with silicon layer thicknesses below 0.4 nm represent a three-dimensional structure of Co45Fe45Zr10 grains weakly ordered in space, while in samples with silicon layer thicknesses above 0.4 nm, t
Original languageEnglish
Pages (from-to)410-416
JournalJournal of Experimental and Theoretical Physics
Issue number3
DOIs
Publication statusPublished - 2014

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