This chapter discusses modern developments in theoretical research of field emission from metals and semiconductors. Emitter shape approximation and methods of electrostatic potential and field strength calculation are considered. It also presents the theory of thermal-field emission (TFE) from metals. Energy distributions of field electrons and TFE electrons emitted from a metal are considered in terms of applications for field emission spectroscopy. Theoretical aspects of phenomena and processes on the emitter surface during field emission are discussed and various theories attempting to explain them are presented.

Original languageEnglish
Title of host publicationSpringer Series in Advanced Microelectronics
PublisherSpringer Nature
Pages115-169
Number of pages55
DOIs
StatePublished - 1 Jan 2017

Publication series

NameSpringer Series in Advanced Microelectronics
Volume60
ISSN (Print)1437-0387

    Research areas

  • Building-up emitter process, Current-voltage characteristic, Electric field calculation, Electron energy distribution, Emission area, Field electron emission, Field emission of semiconductors, Field emission spectroscopy, Fowler–Nordheim plot, Nottingham effect, Phenomenological theory, Surface diffusion, Thermal-field emission, Work function

    Scopus subject areas

  • Electrical and Electronic Engineering

ID: 49549521