Modeling methods of the test inputs for analysis the digital devices

V.I. Melnik, A.N. Mikhailov, V.M. Grishkin, D.A. Ovsyannikov, Y.V. Yelaev

Research output

1 Citation (Scopus)
Original languageEnglish
Title of host publicationModeling methods of the test inputs for analysis the digital devices
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-3
ISBN (Print)9781479956074
DOIs
Publication statusPublished - 2014

Cite this

Melnik, V. I., Mikhailov, A. N., Grishkin, V. M., Ovsyannikov, D. A., & Yelaev, Y. V. (2014). Modeling methods of the test inputs for analysis the digital devices. In Modeling methods of the test inputs for analysis the digital devices (pp. 1-3). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/Emission.2014.6893969
Melnik, V.I. ; Mikhailov, A.N. ; Grishkin, V.M. ; Ovsyannikov, D.A. ; Yelaev, Y.V. / Modeling methods of the test inputs for analysis the digital devices. Modeling methods of the test inputs for analysis the digital devices. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 1-3
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title = "Modeling methods of the test inputs for analysis the digital devices",
author = "V.I. Melnik and A.N. Mikhailov and V.M. Grishkin and D.A. Ovsyannikov and Y.V. Yelaev",
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language = "English",
isbn = "9781479956074",
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Melnik, VI, Mikhailov, AN, Grishkin, VM, Ovsyannikov, DA & Yelaev, YV 2014, Modeling methods of the test inputs for analysis the digital devices. in Modeling methods of the test inputs for analysis the digital devices. Institute of Electrical and Electronics Engineers Inc., pp. 1-3. https://doi.org/10.1109/Emission.2014.6893969

Modeling methods of the test inputs for analysis the digital devices. / Melnik, V.I.; Mikhailov, A.N.; Grishkin, V.M.; Ovsyannikov, D.A.; Yelaev, Y.V.

Modeling methods of the test inputs for analysis the digital devices. Institute of Electrical and Electronics Engineers Inc., 2014. p. 1-3.

Research output

TY - GEN

T1 - Modeling methods of the test inputs for analysis the digital devices

AU - Melnik, V.I.

AU - Mikhailov, A.N.

AU - Grishkin, V.M.

AU - Ovsyannikov, D.A.

AU - Yelaev, Y.V.

PY - 2014

Y1 - 2014

U2 - 10.1109/Emission.2014.6893969

DO - 10.1109/Emission.2014.6893969

M3 - Conference contribution

SN - 9781479956074

SP - 1

EP - 3

BT - Modeling methods of the test inputs for analysis the digital devices

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

Melnik VI, Mikhailov AN, Grishkin VM, Ovsyannikov DA, Yelaev YV. Modeling methods of the test inputs for analysis the digital devices. In Modeling methods of the test inputs for analysis the digital devices. Institute of Electrical and Electronics Engineers Inc. 2014. p. 1-3 https://doi.org/10.1109/Emission.2014.6893969