Methods of modeling of the test inputs for analysis the digital devices

V.I. Melnik, A.N. Mikhailov, V.M. Grishkin, D.A. Ovsyannikov, Y.V. Yelaev

Research output

1 Citation (Scopus)
Original languageEnglish
Title of host publicationMethods of modeling of the test inputs for analysis the digital devices
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages112-113
ISBN (Print)9781479953172
DOIs
Publication statusPublished - 2014

Cite this

Melnik, V. I., Mikhailov, A. N., Grishkin, V. M., Ovsyannikov, D. A., & Yelaev, Y. V. (2014). Methods of modeling of the test inputs for analysis the digital devices. In Methods of modeling of the test inputs for analysis the digital devices (pp. 112-113). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCTPEA.2014.6893309
Melnik, V.I. ; Mikhailov, A.N. ; Grishkin, V.M. ; Ovsyannikov, D.A. ; Yelaev, Y.V. / Methods of modeling of the test inputs for analysis the digital devices. Methods of modeling of the test inputs for analysis the digital devices. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 112-113
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title = "Methods of modeling of the test inputs for analysis the digital devices",
author = "V.I. Melnik and A.N. Mikhailov and V.M. Grishkin and D.A. Ovsyannikov and Y.V. Yelaev",
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language = "English",
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Melnik, VI, Mikhailov, AN, Grishkin, VM, Ovsyannikov, DA & Yelaev, YV 2014, Methods of modeling of the test inputs for analysis the digital devices. in Methods of modeling of the test inputs for analysis the digital devices. Institute of Electrical and Electronics Engineers Inc., pp. 112-113. https://doi.org/10.1109/ICCTPEA.2014.6893309

Methods of modeling of the test inputs for analysis the digital devices. / Melnik, V.I.; Mikhailov, A.N.; Grishkin, V.M.; Ovsyannikov, D.A.; Yelaev, Y.V.

Methods of modeling of the test inputs for analysis the digital devices. Institute of Electrical and Electronics Engineers Inc., 2014. p. 112-113.

Research output

TY - GEN

T1 - Methods of modeling of the test inputs for analysis the digital devices

AU - Melnik, V.I.

AU - Mikhailov, A.N.

AU - Grishkin, V.M.

AU - Ovsyannikov, D.A.

AU - Yelaev, Y.V.

PY - 2014

Y1 - 2014

U2 - 10.1109/ICCTPEA.2014.6893309

DO - 10.1109/ICCTPEA.2014.6893309

M3 - Conference contribution

SN - 9781479953172

SP - 112

EP - 113

BT - Methods of modeling of the test inputs for analysis the digital devices

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

Melnik VI, Mikhailov AN, Grishkin VM, Ovsyannikov DA, Yelaev YV. Methods of modeling of the test inputs for analysis the digital devices. In Methods of modeling of the test inputs for analysis the digital devices. Institute of Electrical and Electronics Engineers Inc. 2014. p. 112-113 https://doi.org/10.1109/ICCTPEA.2014.6893309