Information-expert system for complex diagnostics and investigation of emitters and charged particle beams

L. I. Antonova; V. P. Denisov; N. V. Egorov; A. G. Karpov; A. M. Ovsyannikov; V. R. Tolstyakov; O. A. Kharitonov

Information-expert system for complex diagnostics and investigation of emitters and charged particle beams

L. I. Antonova, V. P. Denisov, N. V. Egorov, A. G. Karpov, A. M. Ovsyannikov, V. R. Tolstyakov, O. A. Kharitonov

Department of Electromechanical and Computer Systems Modelling

Research output: Contribution to journal › Article › peer-review

Abstract

The system is described for measuring a total complex of characteristics of charged particle sources. The system controls, acquires and processes obtained data automatically. The system operates on the base of the IBM PC/AT computers. The soft- and hardware are designed. By means of the system investigations on field electron and ion sources with the current density to 1·10⁸ A/cm² were performed. The composition and specifications of the system are presented.

Original language	Russian
Pages (from-to)	206-207
Number of pages	2
Journal	Pribory i Tekhnika Eksperimenta
Issue number	3
State	Published - 1 May 1995

Scopus subject areas

Instrumentation

Cite this

@article{ad6718c638244285bb8c4abe213b4c49,

title = "Information-expert system for complex diagnostics and investigation of emitters and charged particle beams",

abstract = "The system is described for measuring a total complex of characteristics of charged particle sources. The system controls, acquires and processes obtained data automatically. The system operates on the base of the IBM PC/AT computers. The soft- and hardware are designed. By means of the system investigations on field electron and ion sources with the current density to 1·108 A/cm2 were performed. The composition and specifications of the system are presented.",

author = "Antonova, {L. I.} and Denisov, {V. P.} and Egorov, {N. V.} and Karpov, {A. G.} and Ovsyannikov, {A. M.} and Tolstyakov, {V. R.} and Kharitonov, {O. A.}",

year = "1995",

month = may,

day = "1",

language = "русский",

pages = "206--207",

journal = "ПРИБОРЫ И ТЕХНИКА ЭКСПЕРИМЕНТА",

issn = "0032-8162",

publisher = "Издательство {"}Наука{"}",

number = "3",

}

TY - JOUR

T1 - Information-expert system for complex diagnostics and investigation of emitters and charged particle beams

AU - Antonova, L. I.

AU - Denisov, V. P.

AU - Egorov, N. V.

AU - Karpov, A. G.

AU - Ovsyannikov, A. M.

AU - Tolstyakov, V. R.

AU - Kharitonov, O. A.

PY - 1995/5/1

Y1 - 1995/5/1

N2 - The system is described for measuring a total complex of characteristics of charged particle sources. The system controls, acquires and processes obtained data automatically. The system operates on the base of the IBM PC/AT computers. The soft- and hardware are designed. By means of the system investigations on field electron and ion sources with the current density to 1·108 A/cm2 were performed. The composition and specifications of the system are presented.

AB - The system is described for measuring a total complex of characteristics of charged particle sources. The system controls, acquires and processes obtained data automatically. The system operates on the base of the IBM PC/AT computers. The soft- and hardware are designed. By means of the system investigations on field electron and ion sources with the current density to 1·108 A/cm2 were performed. The composition and specifications of the system are presented.

UR - http://www.scopus.com/inward/record.url?scp=0029296901&partnerID=8YFLogxK

M3 - статья

AN - SCOPUS:0029296901

SP - 206

EP - 207

JO - ПРИБОРЫ И ТЕХНИКА ЭКСПЕРИМЕНТА

JF - ПРИБОРЫ И ТЕХНИКА ЭКСПЕРИМЕНТА

SN - 0032-8162

IS - 3

ER -

Information-expert system for complex diagnostics and investigation of emitters and charged particle beams

Abstract

Scopus subject areas

Other files and links

Cite this