Information-expert system for complex diagnostics and investigation of emitters and charged particle beams

L. I. Antonova, V. P. Denisov, N. V. Egorov, A. G. Karpov, A. M. Ovsyannikov, V. R. Tolstyakov, O. A. Kharitonov

Research output: Contribution to journalArticlepeer-review

Abstract

The system is described for measuring a total complex of characteristics of charged particle sources. The system controls, acquires and processes obtained data automatically. The system operates on the base of the IBM PC/AT computers. The soft- and hardware are designed. By means of the system investigations on field electron and ion sources with the current density to 1·108 A/cm2 were performed. The composition and specifications of the system are presented.

Original languageRussian
Pages (from-to)206-207
Number of pages2
JournalPribory i Tekhnika Eksperimenta
Issue number3
StatePublished - 1 May 1995

Scopus subject areas

  • Instrumentation

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