Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
Increasing of AlGaAs/GaAs quantum well robustness to resonant excitation by lowering Al concentration in barriers. / Solovev, I.A.; Davydov, V.G.; Kapitonov, Yu.V.; Shapochkin, P.Yu.; Efimov, Yu.P.; Lovcjus, V.A.; Eliseev, S.A.; Petrov, V.V.; Ovsyankin, V.V.
Increasing of AlGaAs/GaAs quantum well robustness to resonant excitation by lowering Al concentration in barriers. 2015. p. 012085.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
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TY - GEN
T1 - Increasing of AlGaAs/GaAs quantum well robustness to resonant excitation by lowering Al concentration in barriers
AU - Solovev, I.A.
AU - Davydov, V.G.
AU - Kapitonov, Yu.V.
AU - Shapochkin, P.Yu.
AU - Efimov, Yu.P.
AU - Lovcjus, V.A.
AU - Eliseev, S.A.
AU - Petrov, V.V.
AU - Ovsyankin, V.V.
PY - 2015
Y1 - 2015
N2 - The robustness of AlGaAs/GaAs quantum well to strong resonant excitation is studied. It was found that lowering Al concentration in barriers to 3% does not influence the measured radiative linewidth of exciton resonance in the sample at low intensities. At the same time parasitic broadening of the resonance by an additional resonant illumination is strongly suppressed as compared to the quantum well with 30% of Al in barriers.
AB - The robustness of AlGaAs/GaAs quantum well to strong resonant excitation is studied. It was found that lowering Al concentration in barriers to 3% does not influence the measured radiative linewidth of exciton resonance in the sample at low intensities. At the same time parasitic broadening of the resonance by an additional resonant illumination is strongly suppressed as compared to the quantum well with 30% of Al in barriers.
U2 - 10.1088/1742-6596/643/1/012085
DO - 10.1088/1742-6596/643/1/012085
M3 - Conference contribution
SP - 012085
BT - Increasing of AlGaAs/GaAs quantum well robustness to resonant excitation by lowering Al concentration in barriers
ER -
ID: 3977142