FWI spectral sensitivity analysis in the presence of a free surface // SEG International Exposition and 85th Annual Meeting-2015. https://doi.org/10.1190/segam2015-5898847

V.V. Kazei, B.M. Kashtan, V.N. Troyan, W.A. Mulder

Research output

3 Citations (Scopus)
Original languageUndefined
Publication statusPublished - 2015
Externally publishedYes
EventSEG International Exposition and 85th Annual Meeting - New Orleans
Duration: 17 Oct 201522 Oct 2015
http://www.getech.com/85th-seg-annual-meeting/

Other

OtherSEG International Exposition and 85th Annual Meeting
CountryUnited States
CityNew Orleans
Period17/10/1522/10/15
Internet address

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