Effect of the interface structure in multilayered systems on x-ray specular scattering spectra

V. P. Romanov, S. V. Uzdin, V. M. Uzdin, S. V. Ul'yanov

Research output

Abstract

The effect of the spatial structure of an interface in multilayer metallic films on the spectrum of x-ray specular scattering is studied. Two types of interface structural defects are considered. One type is steps resulting in a variable layer thickness, and the other is the mixing of unlike metal atoms during epitaxial growth. These defects are shown to have different effects on the specular-scattering spectra. The mixing significantly decreases the Bragg-peak height, especially the height of higher order peaks. The interface roughness results in broadening of the Bragg peaks and in the disappearance of intermediate peaks between them.

Original languageEnglish
Pages (from-to)155-163
Number of pages9
JournalPhysics of the Solid State
Volume48
Issue number1
DOIs
Publication statusPublished - 1 Jan 2006

Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Effect of the interface structure in multilayered systems on x-ray specular scattering spectra'. Together they form a unique fingerprint.

  • Cite this