Dielectrics identification using distributed computing

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Abstract

© 2015 IEEE.The paper is dedicated to the creation of analysis tools and diagnostics of dielectric materials using modern methods of information processing. An information expert system which allows the study of dielectric materials has been developed.
Original languageEnglish
Title of host publication2015 International Conference on "Stability and Control Processes" in Memory of V.I. Zubov, SCP 2015 - Proceedings
Pages638-641
DOIs
StatePublished - 2015

Fingerprint

Dive into the research topics of 'Dielectrics identification using distributed computing'. Together they form a unique fingerprint.

Cite this