Detection of the border dead layer in thick quantum wells GaAs/AlGaAs

E. V. Ubyivovk, D. K. Loginov, I. Ya. Gerlovin, Yu. K. Dolgikh, Yu. P. Efimov, S. A. Eliseev, V. V. Petrov, O. F. Vyvenko, A. A. Sitnikova, D. A. Kirilenko

Research output

Original languageUndefined
Title of host publicationXXII Russian Conference of the electron microscopy
Publication statusPublished - 2008

Cite this