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Defect-mediated properties of magnetic tunnel junctions. / Velev, J. P.; Zhuravlev, M. Ye; Belashchenko, K. D.; Jaswal, S. S.; Tsymbal, E. Y.; Katayama, T.; Yuasa, S.

In: IEEE Transactions on Magnetics, Vol. 43, No. 6, 01.06.2007, p. 2770-2775.

Research output: Contribution to journalArticlepeer-review

Harvard

Velev, JP, Zhuravlev, MY, Belashchenko, KD, Jaswal, SS, Tsymbal, EY, Katayama, T & Yuasa, S 2007, 'Defect-mediated properties of magnetic tunnel junctions', IEEE Transactions on Magnetics, vol. 43, no. 6, pp. 2770-2775. https://doi.org/10.1109/TMAG.2007.893311

APA

Velev, J. P., Zhuravlev, M. Y., Belashchenko, K. D., Jaswal, S. S., Tsymbal, E. Y., Katayama, T., & Yuasa, S. (2007). Defect-mediated properties of magnetic tunnel junctions. IEEE Transactions on Magnetics, 43(6), 2770-2775. https://doi.org/10.1109/TMAG.2007.893311

Vancouver

Velev JP, Zhuravlev MY, Belashchenko KD, Jaswal SS, Tsymbal EY, Katayama T et al. Defect-mediated properties of magnetic tunnel junctions. IEEE Transactions on Magnetics. 2007 Jun 1;43(6):2770-2775. https://doi.org/10.1109/TMAG.2007.893311

Author

Velev, J. P. ; Zhuravlev, M. Ye ; Belashchenko, K. D. ; Jaswal, S. S. ; Tsymbal, E. Y. ; Katayama, T. ; Yuasa, S. / Defect-mediated properties of magnetic tunnel junctions. In: IEEE Transactions on Magnetics. 2007 ; Vol. 43, No. 6. pp. 2770-2775.

BibTeX

@article{b09f6f4b1bd2448ba3603e71ead0f6f5,
title = "Defect-mediated properties of magnetic tunnel junctions",
abstract = "Defects play an important role in the properties of metal oxides which are currently used as barrier layers in magnetic tunnel junctions (MTJs). We study the effect of O vacancies on the interlayer exchange coupling (IEC) and tunneling magnetoresistance (TMR) in Fe-MgO-Fe tunnel junctions. Measurements of IEC in fully epitaxial Fe-MgO-Fe(001) tunnel junctions show IEC is antiferromagnetic (AFM) for small MgO thickness but changes sign and then vanishes for large barrier thickness. First-principles calculations based on density functional theory demonstrate that the presence of neutral O vacancies (F-centers) in the MgO barrier can explain this behavior. Resonant tunneling through the F-centers makes IEC AFM for thin barriers but with increasing MgO thickness the resonance contribution to IEC is reduced resulting in the ferromagnetic (FM) coupling typical for perfect MgO barriers. First-principles calculations also show that O vacancies can affect TMR. F-centers produce occupied localized s-states and unoccupied resonant p-states in the gap of MgO. We demonstrate that F-centers affect the conductance by either resonant transmission or nonresonant scattering of tunneling electrons both causing a substantial reduction of TMR compared to the ideal case.",
keywords = "Heterostructures, Magnetic coupling, Magnetic memories, Magnetic recording",
author = "Velev, {J. P.} and Zhuravlev, {M. Ye} and Belashchenko, {K. D.} and Jaswal, {S. S.} and Tsymbal, {E. Y.} and T. Katayama and S. Yuasa",
year = "2007",
month = jun,
day = "1",
doi = "10.1109/TMAG.2007.893311",
language = "English",
volume = "43",
pages = "2770--2775",
journal = "IEEE Transactions on Magnetics",
issn = "0018-9464",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6",

}

RIS

TY - JOUR

T1 - Defect-mediated properties of magnetic tunnel junctions

AU - Velev, J. P.

AU - Zhuravlev, M. Ye

AU - Belashchenko, K. D.

AU - Jaswal, S. S.

AU - Tsymbal, E. Y.

AU - Katayama, T.

AU - Yuasa, S.

PY - 2007/6/1

Y1 - 2007/6/1

N2 - Defects play an important role in the properties of metal oxides which are currently used as barrier layers in magnetic tunnel junctions (MTJs). We study the effect of O vacancies on the interlayer exchange coupling (IEC) and tunneling magnetoresistance (TMR) in Fe-MgO-Fe tunnel junctions. Measurements of IEC in fully epitaxial Fe-MgO-Fe(001) tunnel junctions show IEC is antiferromagnetic (AFM) for small MgO thickness but changes sign and then vanishes for large barrier thickness. First-principles calculations based on density functional theory demonstrate that the presence of neutral O vacancies (F-centers) in the MgO barrier can explain this behavior. Resonant tunneling through the F-centers makes IEC AFM for thin barriers but with increasing MgO thickness the resonance contribution to IEC is reduced resulting in the ferromagnetic (FM) coupling typical for perfect MgO barriers. First-principles calculations also show that O vacancies can affect TMR. F-centers produce occupied localized s-states and unoccupied resonant p-states in the gap of MgO. We demonstrate that F-centers affect the conductance by either resonant transmission or nonresonant scattering of tunneling electrons both causing a substantial reduction of TMR compared to the ideal case.

AB - Defects play an important role in the properties of metal oxides which are currently used as barrier layers in magnetic tunnel junctions (MTJs). We study the effect of O vacancies on the interlayer exchange coupling (IEC) and tunneling magnetoresistance (TMR) in Fe-MgO-Fe tunnel junctions. Measurements of IEC in fully epitaxial Fe-MgO-Fe(001) tunnel junctions show IEC is antiferromagnetic (AFM) for small MgO thickness but changes sign and then vanishes for large barrier thickness. First-principles calculations based on density functional theory demonstrate that the presence of neutral O vacancies (F-centers) in the MgO barrier can explain this behavior. Resonant tunneling through the F-centers makes IEC AFM for thin barriers but with increasing MgO thickness the resonance contribution to IEC is reduced resulting in the ferromagnetic (FM) coupling typical for perfect MgO barriers. First-principles calculations also show that O vacancies can affect TMR. F-centers produce occupied localized s-states and unoccupied resonant p-states in the gap of MgO. We demonstrate that F-centers affect the conductance by either resonant transmission or nonresonant scattering of tunneling electrons both causing a substantial reduction of TMR compared to the ideal case.

KW - Heterostructures

KW - Magnetic coupling

KW - Magnetic memories

KW - Magnetic recording

UR - http://www.scopus.com/inward/record.url?scp=34249021709&partnerID=8YFLogxK

U2 - 10.1109/TMAG.2007.893311

DO - 10.1109/TMAG.2007.893311

M3 - Article

AN - SCOPUS:34249021709

VL - 43

SP - 2770

EP - 2775

JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

SN - 0018-9464

IS - 6

ER -

ID: 51234948