Comparative study of the X-ray reflectivity and in-depth profile of a-C, B4C and Ni coatings at 0.1-2 keV

I.V. Kozhevnikov, E.O. Filatova, A.A. Sokolov, A.S. Konashuk, F. Siewert, M. Störmer, J. Gaudin, B. Keitel, L. Samoylova, H. Sinn

Research output

7 Citations (Scopus)
Original languageEnglish
Title of host publicationComparative study of the X-ray reflectivity and in-depth profile of a-C, B4C and Ni coatings at 0.1-2 keV
Pages348-353
DOIs
Publication statusPublished - 2015

Cite this

Kozhevnikov, I. V., Filatova, E. O., Sokolov, A. A., Konashuk, A. S., Siewert, F., Störmer, M., Gaudin, J., Keitel, B., Samoylova, L., & Sinn, H. (2015). Comparative study of the X-ray reflectivity and in-depth profile of a-C, B4C and Ni coatings at 0.1-2 keV. In Comparative study of the X-ray reflectivity and in-depth profile of a-C, B4C and Ni coatings at 0.1-2 keV (pp. 348-353) https://doi.org/10.1107/S1600577515000430