Automated test development system for digital devices

Valery M. Grishkin, Dmitry A. Ovsyannikov, Yevgeny V. Е, Nikolay S. Maschinskiy

Research output

Abstract

The system of computer-aided test development is proposed in the article. The system operation is based on the model of digital device, also system allows to form test as a set of input actions and reactions of model to them. The technology for creating and debugging of tests provides a predetermined test coverage. Input actions are formed according to the interface approach. The interface approach allows to work with the model of digital device at the transaction level, but not at the signal level. This method greatly simplifies and accelerates the process of searching for test sequences. The proposed system structure supports the suggested technology and implements search of test sequences with a predetermined coverage criterion. The developed methodology allows to create a test check programs and diagnostics test program of the digital device, without any information about the destination and operation algorithm of a control object. The system checks the digital device serviceability and its operational suitability.

Original languageEnglish
Title of host publicationMoscow Workshop on Electronic and Networking Technologies, MWENT 2018 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
Volume2018-March
ISBN (Electronic)9781538634974
DOIs
Publication statusPublished - 12 Apr 2018
Event1st Moscow Workshop on Electronic and Networking Technologies, MWENT 2018 - Moscow
Duration: 14 Mar 201816 Mar 2018

Conference

Conference1st Moscow Workshop on Electronic and Networking Technologies, MWENT 2018
CountryRussian Federation
CityMoscow
Period14/03/1816/03/18

Fingerprint

Digital devices
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methodology

Scopus subject areas

  • Computer Networks and Communications
  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Electronic, Optical and Magnetic Materials
  • Instrumentation

Cite this

Grishkin, V. M., Ovsyannikov, D. A., Е, Y. V., & Maschinskiy, N. S. (2018). Automated test development system for digital devices. In Moscow Workshop on Electronic and Networking Technologies, MWENT 2018 - Proceedings (Vol. 2018-March, pp. 1-4). [8337227] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MWENT.2018.8337227
Grishkin, Valery M. ; Ovsyannikov, Dmitry A. ; Е, Yevgeny V. ; Maschinskiy, Nikolay S. / Automated test development system for digital devices. Moscow Workshop on Electronic and Networking Technologies, MWENT 2018 - Proceedings. Vol. 2018-March Institute of Electrical and Electronics Engineers Inc., 2018. pp. 1-4
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Grishkin, VM, Ovsyannikov, DA, Е, YV & Maschinskiy, NS 2018, Automated test development system for digital devices. in Moscow Workshop on Electronic and Networking Technologies, MWENT 2018 - Proceedings. vol. 2018-March, 8337227, Institute of Electrical and Electronics Engineers Inc., pp. 1-4, Moscow, 14/03/18. https://doi.org/10.1109/MWENT.2018.8337227

Automated test development system for digital devices. / Grishkin, Valery M.; Ovsyannikov, Dmitry A.; Е, Yevgeny V.; Maschinskiy, Nikolay S.

Moscow Workshop on Electronic and Networking Technologies, MWENT 2018 - Proceedings. Vol. 2018-March Institute of Electrical and Electronics Engineers Inc., 2018. p. 1-4 8337227.

Research output

TY - GEN

T1 - Automated test development system for digital devices

AU - Grishkin, Valery M.

AU - Ovsyannikov, Dmitry A.

AU - Е, Yevgeny V.

AU - Maschinskiy, Nikolay S.

PY - 2018/4/12

Y1 - 2018/4/12

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AB - The system of computer-aided test development is proposed in the article. The system operation is based on the model of digital device, also system allows to form test as a set of input actions and reactions of model to them. The technology for creating and debugging of tests provides a predetermined test coverage. Input actions are formed according to the interface approach. The interface approach allows to work with the model of digital device at the transaction level, but not at the signal level. This method greatly simplifies and accelerates the process of searching for test sequences. The proposed system structure supports the suggested technology and implements search of test sequences with a predetermined coverage criterion. The developed methodology allows to create a test check programs and diagnostics test program of the digital device, without any information about the destination and operation algorithm of a control object. The system checks the digital device serviceability and its operational suitability.

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KW - Electronic equipment testing

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KW - test check

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Grishkin VM, Ovsyannikov DA, Е YV, Maschinskiy NS. Automated test development system for digital devices. In Moscow Workshop on Electronic and Networking Technologies, MWENT 2018 - Proceedings. Vol. 2018-March. Institute of Electrical and Electronics Engineers Inc. 2018. p. 1-4. 8337227 https://doi.org/10.1109/MWENT.2018.8337227