Analysis of the Computational Aspects of the Applied Optimization Algorithms

I. V. Zaitseva, E. I. Rubtsova, O. A. Malafeyev, I. A. Bogolyubova, S. A. Sychev

Research outputpeer-review

Abstract

When solving applied optimization problems, questions arise in analyzing the computational aspects of the methods used. The use of test problem generators is the most promising in this direction. We consider the implementation of the test problem generator that meets these requirements and allows us to generate the following classes of test problems: degenerate, ill-conditioned, indefinite, convex, and general- purpose tasks.

Original languageEnglish
Title of host publication2019 International Multi-Conference on Industrial Engineering and Modern Technologies, FarEastCon 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728100616
DOIs
Publication statusPublished - Oct 2019
Event2019 International Multi-Conference on Industrial Engineering and Modern Technologies, FarEastCon 2019 - Vladivostok
Duration: 1 Oct 20194 Oct 2019

Publication series

Name2019 International Multi-Conference on Industrial Engineering and Modern Technologies, FarEastCon 2019

Conference

Conference2019 International Multi-Conference on Industrial Engineering and Modern Technologies, FarEastCon 2019
CountryRussian Federation
CityVladivostok
Period1/10/194/10/19

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Scopus subject areas

  • Artificial Intelligence
  • Computer Science Applications
  • Hardware and Architecture
  • Information Systems and Management
  • Energy Engineering and Power Technology
  • Industrial and Manufacturing Engineering
  • Safety, Risk, Reliability and Quality

Cite this

Zaitseva, I. V., Rubtsova, E. I., Malafeyev, O. A., Bogolyubova, I. A., & Sychev, S. A. (2019). Analysis of the Computational Aspects of the Applied Optimization Algorithms. In 2019 International Multi-Conference on Industrial Engineering and Modern Technologies, FarEastCon 2019 [8934829] (2019 International Multi-Conference on Industrial Engineering and Modern Technologies, FarEastCon 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/FarEastCon.2019.8934829