An interference method for measuring certain parameters of a substance in the vicinity of the critical state is proposed. The essence of the method is to decipher the interference pattern arising upon grazing incidence of a laser beam on a curved liquid-vapor interface. The deciphering allows one to determine the difference between the refractive indices of the two phases and the scaling factor of the wetting meniscus shape. This, in turn, makes it possible to calculate the critical exponents for the temperature dependences of the surface tension and the difference in the densities of the two phases. The ratio of these critical exponents for xenon, measured in the paper, is 3.81 ± 0.03.
|Number of pages||5|
|Journal||Optics and Spectroscopy (English translation of Optika i Spektroskopiya)|
|State||Published - 1 Jul 2004|
Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics