An interference method for studying a substance in the vicinity of its critical point

V. G. Domelunksen, I. R. Krylov, G. A. Polyanskaya, M. A. Tsygankov

Research output: Contribution to journalArticlepeer-review

Abstract

An interference method for measuring certain parameters of a substance in the vicinity of the critical state is proposed. The essence of the method is to decipher the interference pattern arising upon grazing incidence of a laser beam on a curved liquid-vapor interface. The deciphering allows one to determine the difference between the refractive indices of the two phases and the scaling factor of the wetting meniscus shape. This, in turn, makes it possible to calculate the critical exponents for the temperature dependences of the surface tension and the difference in the densities of the two phases. The ratio of these critical exponents for xenon, measured in the paper, is 3.81 ± 0.03.

Original languageEnglish
Pages (from-to)136-140
Number of pages5
JournalOptics and Spectroscopy (English translation of Optika i Spektroskopiya)
Volume97
Issue number1
DOIs
StatePublished - 1 Jul 2004

Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

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