Accounting for the plasma background radiation influence and calibration curve export in atomic emission spectrometry with CCD-based registration system when determining metal and alloy impurities

V. S. Sukhomlinov, A. S. Mustafaev, A. N. Popova

Research output: Contribution to journalConference articlepeer-review

Abstract

This paper is dedicated to development and application of an algorithm allowing determining an accurate actual value of the plasma background radiation under the analytic element line using standard data obtained from emission spectrometer registration system. A unique technique has been developed that allows calibrating spectrometers in the range of small concentration of impurities with two standard samples, which is very relevant for analysis of metals and alloys, powdered samples, ultrapure materials. The paper demonstrates efficiency of this technique when applied to series-produced emission spectrometers manufactured in Russia.

Original languageEnglish
Article number012044
JournalJournal of Physics: Conference Series
Volume1753
Issue number1
DOIs
StatePublished - 8 Feb 2021
EventInternational Conference on Innovations, Physical Studies and Digitalization in Mining Engineering 2020, IPDME 2020 - Saint Petersburg, Russian Federation
Duration: 23 Apr 202024 Apr 2020

Scopus subject areas

  • Physics and Astronomy(all)

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