A model of nanosized thin film coating with sinusoidal interface

Kostyrko, S.A., Grekov, M.A., Altenbach Holm

Research output

2 Citations (Scopus)

Abstract

In this paper, we present an approach to the stress concentration analysis of an isotropic ultra-thin film coating with thickness from hundreds to a few nanometers coherently bonded to a substrate through an undulated interphase region. To capture the size dependence of the mechanical properties observed in nanostructured materials, we use Gurtin-Murdoch model in which surface and interphase domains are represented as negligibly thin layers ideally adhering to the bulk phases. This model is characterized by traction discontinuities at the surface and interface where the additional surface and interface stresses appear due to different bond lengths, angles and charge distribution of surface and interface atoms. In the case of plane strain conditions, the elasticity solution for a four-phase system is derived in the terms of the Goursat-Kolosovs complex potentials.

Original languageEnglish
Pages (from-to)070017-1–070017-8
Number of pages8
JournalAIP Conference Proceedings
Volume1959
DOIs
Publication statusPublished - 2 May 2018

Fingerprint

Coating
Thin Films
coatings
thin films
Nanostructured Materials
Complex Potential
stress concentration
Stress Concentration
traction
plane strain
Plane Strain
Thin Layer
Model
charge distribution
Mechanical Properties
Elasticity
Discontinuity
discontinuity
elastic properties
Substrate

Scopus subject areas

  • Mathematics(all)

Cite this

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A model of nanosized thin film coating with sinusoidal interface. / Kostyrko, S.A., ; Grekov, M.A.; Altenbach Holm.

In: AIP Conference Proceedings, Vol. 1959, 02.05.2018, p. 070017-1–070017-8.

Research output

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