• 322 Citations
  • 10 h-Index
20042020

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2016

Secondary Electron Generation in the Helium Ion Microscope: Basics and Imaging

Petrov, Y. V. & Vyvenko, O. F., 2016, Helium Ion Microscopy. Hlawacek, G. & Gölzhäuser, A. (eds.). Springer Nature, p. 119-146 ( NanoScience and Technology).

Research outputpeer-review

5 Citations (Scopus)