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Research Output 2004 2020

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2016
5 Citations (Scopus)

Secondary Electron Generation in the Helium Ion Microscope: Basics and Imaging

Petrov, Y. V. & Vyvenko, O. F., 2016, Helium Ion Microscopy. Hlawacek, G. & Gölzhäuser, A. (eds.). Springer, p. 119-146 ( NanoScience and Technology).

Research output

ion microscopes
helium ions
microscopy
electrons
ions